Measurement of Submilligram Masses Using Electrostatic Force
نویسندگان
چکیده
منابع مشابه
Measuring dielectric properties at the nanoscale using Electrostatic Force Microscopy
R. Arinero, C. Riedel, G. A. Schwartz, G. Lévêque, A. Alegría, Ph. Tordjeman, N. E. Israeloff, M. Ramonda and J. Colmenero 1 IES, UMR CNRS 5214, Université Montpellier II, CC 083, Place E. Bataillon, 34095 Montpellier Cedex, France 2 Donostia International Physics Center (DIPC), Paseo Manuel de Lardizábal 4, 20018 San Sebastián, Spain. 3 Departamento de Física de Materiales UPV/EHU, Facultad de...
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ژورنال
عنوان ژورنال: IEEE Transactions on Instrumentation and Measurement
سال: 2019
ISSN: 0018-9456,1557-9662
DOI: 10.1109/tim.2018.2886867